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A device for comprehensive evaluation from manufacturing to imaging performance
NH-3N Standard system in the NH Series combining superior functionality with high cost performance
Stitching measurement technology making m measurement of concavity of 60° or more
NH-3SP High precision version with maximum measurement precision and resolution
NH-4N Ideal for quality control of high density and increasingly large semiconductor products such as 8-inch wafers and lead frames
NH-5N Makes high-precision measurement of large, heavy-weight goods such as precision molds with portal structures
NH-6N Direct measurement of LCD patterns, large aspherical mirrors, etc.

MITAKA / RYOKOSHA
 
This equipment has made complete non-contact, high precision, automatic measurement of shape, dimensions and surface roughness possible with a laser probe system. It provides multi-measurement functionality for a wide range of uses from R&D to quality control of the manufacturing line for photonic devices, semiconductor products, ultra-precision machining parts, etc. for which the market will demand smaller products with higher precision and lower costs.

Features

  • Four years after first being sold, the NH-3, which has become a byword for non-contact height measurement, has evolved into the new NH-3N, implementing feedback on the functions of the high precision NH-3 SP.
  • Experience the world of ultimate non-contact measurement which features auto focus functionality that is not affected by low reflectivity and completely non-destructive measurement, at the same time pushing the edge of precision for Z, X and Y measurements.

Specifications / Measuring Functions

Specifications

 
Minimum height resolution 0.01µm
Absolute height accuracy ±1µm/10mm
Height reproducibility σ=0.03µm or less
Height measuring range 10mm(~100mm)
Minimum X,Y resolution 0.1µm
Absolute X,Y accuracy: ±(1+5L/150)µm
X,Y measuring range: 150~150mm`
Control software Windows NT 4.0


Measuring Functions

  3D shape measurement, cross-sectional shape measurement, roughness measurement, automatic measurement, various measuring functions



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